Apparatus and method for characterizing a replica tape

An apparatus for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material, the replica tape including a first surface and an opposing second surface replicating the surface of the material on which the replica tape was embossed, compressed or cast, the second surface of the replica tape having a plurality of measurement points extending along a first direction substantially perpendicular to a thickness of the replica tape extending in a second direction between the first and second surfaces of the replica tape, wherein the apparatus comprises:

• a first holding component having opposing first and second surfaces in the second direction, the first surface of the first holding component being configured to support the second surface of the replica tape thereon;
• a second holding component having opposing first and second surfaces in the second direction, the second holding component being configured to be pressed against the first surface of the replica tape to secure the replica tape between the first surface of the first holding component and the second surface of the second holding component;
• a light source arranged a first distance from the first surface of the second holding component and configured to transmit light in the second direction through the first and second surfaces of the second holding component, the first and second surfaces of the replica tape, and the first and second surfaces of the first holding component;
• an image sensor arranged a second distance from the second surface of the first holding component and configured to measure an intensity of the light respectively transmitted through at least two of the plurality of measurement points of the second surface of the replica tape;
• and
• a processing unit configured to receive the measured intensity of the light transmitted through the at least two of the plurality measurement points and convert the measured light intensity at the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.