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US 2014/0191779 A1Published application
Crosstalk suppression in wireless testing of semiconductor devices
AssigneeSTMicroelectronics S.r.l.
InventorAlberto Pagani
Life of this patent
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Abstract
An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be used for the wireless test of the integrated circuit are integrated on the semiconductor material die.
Claims8
1-12. (canceled)
An apparatus, comprising:
- a wireless probe card having a plurality of wireless units, the plurality of wireless units including at least a first wireless unit and a second wireless unit,
- wherein the first wireless unit is configured to wirelessly communicate with a first integrated circuit die at a first frequency, and
- wherein the second wireless unit is configured to wirelessly communicate with a second integrated circuit die at a second frequency different than the first frequency.
Dependencies are inferred from the claim text.