Method and system for measuring the resistance of a resistive structure

A method of measuring resistance of a resistive structure having a first node at a first end of the resistive structure, a second node at a second end of the resistive structure, and a third node between the first node and the second node of the resistive structure and adapted to receive a calibration current;

• a signal conditioning circuit comprising a first input coupled to the first node of the resistive structure, a second input coupled to the second node of the resistive structure, a third input coupled to the third node of the resistive structure;
• and an output, the method comprising:
• determining a first calibration signal by measuring a voltage at the output when no calibration current is injected into the third node of the resistive structure;
• injecting a calibration current into the third node of the resistive structure;
• determining a second calibration signal by:
• interpolating voltages at the first and second nodes of the resistive structure;
• and
• subtracting the interpolated voltage from a voltage at the third node of the resistive structure;
• and
• determining an absolute value of a difference between the determined first calibration signal and the determined second calibration signal, wherein the absolute value is proportional to a product of the resistance of the resistive structure and the calibration current.