Signal test device

A signal test device for an electronic device, comprising:

• a hollow probe column comprising a bottom wall;
• a first conductive piece mounted in the probe column;
• a probe pin slidably mounted to the bottom wall of the probe column, and comprising a first end located outside the probe column and configured to contact with a signal terminal of the electronic device, and a second end located inside the probe column;
• a second conductive piece electrically connected to the second end of the probe pin and movable with the probe pin;
• a cable comprising a signal line connected between an oscilloscope and the first conductive piece, and a ground line;
• and
• a ground terminal to contact with a ground end of the electronic device, wherein the ground line of the cable is connected between the oscilloscope and the ground terminal;
• wherein when the first end of the probe pin is pressed to the signal terminal of the electronic device, and the ground terminal is contacted with the ground end of the electronic device, the probe pin moves into the probe column, the second conductive piece contacts the first conductive piece;
• when the second conductive piece contacts the first conductive piece, a snapshot of a waveform of the electronic device is captured and shown on the oscilloscope.