Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage
AssigneeSamsung Electronics Co., Ltd.
InventorHwan-soo SUH
Life of this patent
Estimating the term…
Abstract
A sample stage for microscopy includes a sample holder including a body in which a sample-mounting part and a seating part are provided on a bottom of the body and a grip part for a mounting unit is provided on a top of the body, a sample rack, on which the sample holder is mounted, including a supporter supporting the seating part of the sample holder, and an elastic element provided on the sample rack, providing the sample holder with a pressing force inclined with respect to a vertical direction and fastening the sample holder to the sample rack while the seating part is being supported by the supporter. The sample stage may be vertically mounted.
Claims20
A sample stage for microscopy, capable of being vertically mounted, the sample stage comprising:
- a sample holder comprising a body having a sample-mounting part and a seating part provided on a bottom of the body;
- a sample rack, on which the sample holder is mounted, comprising a supporter configured to support the seating part of the sample holder;
- and
- an elastic element provided on the sample rack, configured to provide the sample holder with a pressing force inclined with respect to a vertical direction and configured to fasten the sample holder to the sample rack.
A sample stage for microscopy, capable of being vertically mounted, the sample stage comprising:
- a sample rack comprising:
- a recessed part;
- and
- a plurality of V-shaped grooves provided on a bottom surface of the recessed part and are not parallel to one another;
- a sample holder comprising:
- a body inserted into the recessed part, and
- a plurality of position-determining projections protruding from a bottom surface of the body and supported by the plurality of V-shaped grooves;
- and
- an elastic element provided on the sample rack, configured to provide the sample holder with a pressing force inclined with respect to a vertical direction and configured to fasten the sample holder to the sample rack.
A scanning probe microscope comprising:
- a sample stage for microscopy configured to be vertically mounted, the sample stage comprising:
- a sample holder comprising a body in which a sample-mounting part and a seating part are provided on a bottom of the body;
- a sample rack, on which the sample holder is mounted, comprising a supporter configured to support the seating part of the sample holder;
- and
- an elastic element provided on the sample rack, configured to provide the sample holder with a pressing force inclined with respect to a vertical direction and configured to fasten the sample holder to the sample rack;
- a probe configured to access a sample mounted on the sample-mounting part via a hollow part provided in the sample rack;
- and
- a control unit configured to derive a measurement result from at least one of mechanical, electrical, and chemical signals received from the probe.
Dependencies are inferred from the claim text.