Semiconductor apparatus and fabrication method thereof
AssigneeSK hynix Inc.
InventorsMin Yong LEE, Jin Ku LEE, Jong Chul LEE
Life of this patent
Estimating the term…
Abstract
The semiconductor apparatus includes a semiconductor substrate, an insulating layer formed in the semiconductor substrate to be spaced from a surface of the semiconductor substrate by a predetermined depth and formed to extend to a first direction to have a predetermined width, and an active region formed to be in contact with the semiconductor substrate below the insulating layer through a source post that is formed to vertically penetrate a predetermined portion of the insulating layer, and formed on the insulating layer and the source post to extend to the first direction to have a predetermined width.
Claims18
A semiconductor apparatus, comprising:
- a semiconductor substrate;
- an insulating layer formed in the semiconductor substrate to be spaced from a surface of the semiconductor substrate by a predetermined depth, and formed to extend to a first direction to have a predetermined width;
- and
- an active region formed to be in contact with the semiconductor substrate below the insulating layer through a source post that is formed to vertically penetrate a predetermined portion of the insulating layer, and formed on the insulating layer and the source post to extend to the first direction to have a predetermined width.
A method of fabricating a semiconductor apparatus, the method comprising:
- forming an insulating layer in a semiconductor substrate to be spaced from a surface of the semiconductor substrate by a predetermined depth, thereby confining a first semiconductor layer on the insulating layer;
- patterning predetermined portions of the first semiconductor layer and the insulating layer to expose the surface of the semiconductor substrate below the insulating layer;
- forming a semiconductor layer burying the patterned portions using the first semiconductor layer;
- and
- patterning the semiconductor layer burying the patterned portion and the remaining insulating layer to extend to the first direction to form an active region.
Dependencies are inferred from the claim text.