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US 2014/0157001 A1Published application
Secure testing of semiconductor device
AssigneeBroadcom Corporation
InventorsMark Leonard Buer, Norayr Norik Dzhendzhapanyan
Life of this patent
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Abstract
A method includes testing, by a processor, a secure portion of a semiconductor device through a first interface between the processor and the semiconductor device; and sending, by the processor, a pass or fail indication of a result of the testing of the secure portion of the semiconductor device to the tester through a second interface between the processor and the tester.
Claims20
An apparatus, comprising:
- a first interface configured to communicate with a semiconductor device;
- a second interface configured to communicate with a tester;
- and
- a processor configured to test a secure portion of the semiconductor device,
- wherein the processor is configured to send a result of testing of the secure portion of the semiconductor device to the tester through the second interface.
2 more elements
A method, comprising:
- testing, by a processor, a secure portion of a semiconductor device through a first interface between the processor and the semiconductor device;
- and
- sending, by the processor, a pass or fail indication of a result of the testing of the secure portion of the semiconductor device to the tester through a second interface between the processor and the tester.
A computer program product, embodied on a non-transitory computer-readable medium, comprising:
- computer code for testing a secure portion of a device by a processor;
- and
- computer code for sending results of the testing from the processor to a tester, wherein the results include an indication of pass or fail, and wherein the tester is isolated from the secure portion of the device.
Dependencies are inferred from the claim text.