Quantitative analysis and visualization of spatial points
AssigneeYale University
InventorsDerek K. Toomre, Brian T. McNellis
Life of this patent
Estimating the term…
Loading patent…
AssigneeYale University
InventorsDerek K. Toomre, Brian T. McNellis
Estimating the term…
A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
A computer implemented method for analyzing spatial point patterns in a region comprising:
A computer program product including a non-transitory computer-storage medium having instructions stored thereon for processing data information, such that the instructions, when carried out by a processing device, cause the processing device to perform operations of:
A system for analyzing spatial point patterns in a region comprising:
Dependencies are inferred from the claim text.