Rf testing system
AssigneeMediatek Inc.
InventorsYen-Liang CHEN, Chun-Hsien PENG, Ying-Chou SHIH, Yu-An CHEN, Chun-Wei YANG
Life of this patent
Estimating the term…
Abstract
An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.
Claims24
An integrated circuit (IC), comprising
- an RF transmitter configured to generate an RF signal in response to a command signal from test equipment;
- an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result,
- wherein the test equipment is external to the IC.
An integrated circuit (IC), comprising:
- an RF transmitter configured to generate an RF signal in response to a command signal from test equipment, and transmits the RF signal to a module circuitry for performing signal conversion by the module circuitry to generate an evaluation signal, wherein the evaluation signal is reported to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result,
- wherein the test equipment and the module circuitry are both external to the IC.
An integrated circuit (IC), comprising:
- an RF receiver configured to receives an RF signal from a module circuitry in response to a command signal from test equipment, generate an evaluation signal according to the received RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result,
- wherein the module circuitry and the test equipment are both external to the IC.
Test equipment communicating with an integrated circuit (IC), comprising:
- a control port configured to send a command signal to the IC for initiating a RF test process;
- an input port configured to receive an evaluation signal indicative of an electrical characteristic of an RF signal of the IC, wherein the evaluation signal is a baseband signal;
- and
- a test analyzer configured to perform a test analysis on the evaluation signal to determine a test result.
A radio frequency (RF) testing system, comprising:
- test equipment;
- a module circuitry;
- and
- an integrated circuit (IC) configured to communicate with the module circuitry by an RF signal in response to a command signal from the test equipment, generate an evaluation signal by the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine the test result,
- wherein the module circuitry is external to the IC and the test equipment.
A radio frequency (RF) testing system, comprising:
- test equipment;
- a module circuitry;
- and
- an integrated circuit (IC) configured to communicate with the module circuitry by an RF signal in response to a command signal from the test equipment,
- wherein the module circuitry generates an evaluation signal according to the RF signal from the IC, and reports the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine the test result,
- wherein the module circuitry is external to the IC and the test equipment.
Dependencies are inferred from the claim text.