Semiconductor Constructions, Memory Arrays, Methods of Forming Semiconductor Constructions and Methods of Forming Memory Arrays
AssigneeMicron Technology, Inc.
InventorsFabio Pellizzer, Cinzia Perrone
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AssigneeMicron Technology, Inc.
InventorsFabio Pellizzer, Cinzia Perrone
Estimating the term…
Some embodiments include methods of forming semiconductor constructions. Carbon-containing material is formed over oxygen-sensitive material. The carbon-containing material and oxygen-sensitive material together form a structure having a sidewall that extends along both the carbon-containing material and the oxygen-sensitive material. First protective material is formed along the sidewall. The first protective material extends across an interface of the carbon-containing material and the oxygen-sensitive material, and does not extend to a top region of the carbon-containing material. Second protective material is formed across the top of the carbon-containing material, with the second protective material having a common composition to the first protective material. The second protective material is etched to expose an upper surface of the carbon-containing material. Some embodiments include semiconductor constructions, memory arrays and methods of forming memory arrays.
A method of forming a semiconductor construction, comprising:
A method of forming a memory array, comprising:
19-36. (canceled)
Dependencies are inferred from the claim text.