Defect detection method, method for repairing organic el element, and organic el display panel

A defect detection method performed with respect to an organic EL element including a first electrode, a second electrode, a functional layer, and a light-emission layer, the functional layer and the light-emission layer disposed between the first electrode and the second electrode, the method comprising:

• applying a first voltage between the first electrode and the second electrode, the first voltage, when the organic EL element includes a defective portion, between the first electrode and the second electrode, that is a potential cause of non-light emission of the light-emission layer, reducing an electrical resistance of a first portion of the functional layer, the first portion being a portion of the functional layer corresponding to the defective portion;
• and
• applying, after the application of the first voltage, a second voltage between the first electrode and the second electrode and thus detecting whether or not the organic EL element is a dark spot, the second voltage, when the organic EL element does not include the defective portion, causing the light-emission layer to emit light, the dark spot being an organic EL element whose light-emission layer does not emit light.