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AssigneesBoe Technology Group Co., Ltd., Hefei Boe Optoelectronics Technology Co., Ltd.
InventorYangkun Jing
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The invention relates to the technical field of LDC fabrication and specifically to a high and low temperature test equipment. The high and low temperature test equipment comprises a housing, and further comprises a partition disposed in the interior of the housing. The partition divides the interior of the housing into a plurality of chambers and is provided with a Peltier effect sheet. The Peltier effect sheet is used for, when it is powered-on, cooling at least one of the chambers and meanwhile heating at least one chamber other than the at least one of the chambers. The high and low temperature test equipment may cool and heat at the same time in an efficient, power conserving way and have uniform heating function.
A high and low temperature test equipment comprising a housing, characterized in that the equipment further comprises a partition disposed in the Interior of the housing, the partition dividing the interior of the housing into a plurality of chambers, and being provided with a Peltier effect sheet which is used for, when it is powered-on, cooling at least one of the chambers and meanwhile heating at least one chamber other than the at least one of the chambers.
Dependencies are inferred from the claim text.