Method and system for emissivity determination
AssigneeSiemens Aktiengesellschaft
InventorsMax Rothenfusser, Michael Stockmann
Life of this patent
Estimating the term…
Abstract
A surface of an object is irradiated using an infrared light beam. The infrared light beams reflected at the object are received by an infrared camera which captures a first intensity of the reflected infrared light beams on a detector of the infrared camera. Ambient radiation reflected at the object and the characteristic radiation of the object are detected by capturing a second intensity of the reflected ambient radiation and the characteristic radiation of the object on the detector of the infrared camera. The emissivity of the object is calculated based on the first intensity and the second intensity.
Claims15
1-14. (canceled)
A method for determining emissivity of an object, comprising:
- irradiating a surface of the object with an infrared light beam;
- receiving reflected infrared light beams, reflected at the object, using an infrared camera;
- acquiring a first intensity of the reflected infrared light beams on a detector of the infrared camera;
- receiving reflected surrounding radiation reflected at the object and inherent radiation of the object using the infrared camera;
- acquiring a second intensity of the reflected surrounding radiation and the inherent radiation of the object on the detector of the infrared camera;
- and
- calculating the emissivity of the object based on the first intensity and the second intensity.
A device for determining emissivity of an object using an infrared camera, comprising:
- an emitter device, including:
- an infrared emitter, which emits infrared light beams over a predetermined wavelength range, and
- an aperture stop, which is configured to focus at least some of the infrared light beams emitted by the infrared emitter into a substantially parallel light beam and to transmit the substantially parallel light beam to a surface of the object;
- and
- an evaluation apparatus with a control apparatus, coupled to said emitter device and the infrared camera, the control apparatus configured to actuate the infrared camera in acquiring an intensity of the substantially parallel light beam reflected from the surface of the object and to synchronize emission of the infrared light beams by the infrared emitter with the acquiring of the intensity by the infrared camera.
A system for determining emissivity of an object, comprising:
- an infrared camera, including a detector acquiring intensity of infrared light beams received by said camera;
- an emitter device, including:
- an infrared emitter, which emits the infrared light beams over a predetermined wavelength range, and
- an aperture stop, which is configured to focus at least some of the infrared light beams emitted by the infrared emitter into a substantially parallel light beam and to transmit the substantially parallel light beam to a surface of the object;
- and
- an evaluation apparatus with a control apparatus, coupled to said emitter device and said infrared camera, the control apparatus configured to actuate said infrared camera in acquiring an intensity of the substantially parallel light beam reflected from the surface of the object and to synchronize emission of the infrared light beams by the infrared emitter with the acquiring of the intensity by said infrared camera.
Dependencies are inferred from the claim text.