Method and apparatus for processing image
AssigneesIndustry-Academic Cooperation Foundation, Yonsei University, Samsung Techwin Co., Ltd.
InventorsJeong-Ahn LEE, Min-seok LEE, Ji-yong KWON, Moon-gi KANG
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Abstract
Exemplary embodiments disclose a method of processing an image. The method includes: offsetting aliasing by analyzing frequency characteristics of at least one color channel and a NIR channel, of a MSFA pattern image; generating a high resolution base image; and offsetting an artifact from the high resolution base image by weighting the high resolution base image and a blur image, based on a pixel difference value between the blur image and the high resolution base image.
Claims20
A method of processing an image, the method comprising:
- offsetting aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image;
- generating a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image;
- and
- offsetting an artifact from the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.
A method of processing an image, the method comprising:
- offsetting aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image, and combining the at least one color channel and the NIR channel such that phase characteristics of the at least one color channel and the NIR channel offset each other;
- generating a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image using a sinc function, wherein a cutoff frequency wc of the sinc function is adaptively set according to statistical characteristics of a local region obtained from the MSFA pattern image;
- and
- offsetting an artifact of the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.
An apparatus for processing an image, the apparatus comprising:
- an aliasing offset device configured to offset aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image;
- a high resolution base image generator configured to generate a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel from which the aliasing is removed, up to a resolution of a base image;
- and
- an artifact offset device configured to offset an artifact from the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.
An apparatus for processing an image, the apparatus comprising:
- an aliasing offset device configured to offset aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image, and combining the at least one color channel and the NIR channel such that phase characteristics of the at least one color channel and the NIR channel offset each other;
- a high resolution base image generator configured to generate a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image using a sinc function, wherein a cutoff frequency wc of the sinc function is adaptively set according to statistical characteristics of a local region obtained from the MSFA pattern image;
- and
- an artifact offset device configured to offset an artifact of the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.
Dependencies are inferred from the claim text.