A doped, epitaxially grown III-N bulk crystal, wherein III denotes at least one element of the main group III of the periodic system selected from Al, Ga and In, wherein the doped III-N bulk crystal satisfies at least one of the following conditions (a) to (c):
- (a) in a micro-Raman mapping on a plane
- (i) parallel to a growth plane and/or
- (ii) in a growth direction
- a standard deviation of the measured frequency positions of the LPP+-mode
- in case of (i) is 5% or lower, and
- in case of (ii) is 10% or lower:
- (b) in an MDP mapping on a plane
- (i) parallel to a growth plane and/or
- (ii) in a growth direction
- a standard deviation of the photoconductivity signals
- in case of (i) is 5% or lower, and
- in case of (ii) is 10% or lower;
- (c) in a micro photoluminescence mapping on a plane
- (i) parallel to a growth plane and/or
- (ii) in a growth direction
- a standard deviation of the line width of the D0X transition
- in case of (i) is 5% or lower, and
- in case of (ii) is 10% or lower.