Three dimensional transducer

A testing instrument for mechanical testing at a one or more of nano or micron scale comprising:

• a transducer body;
• a coupling shaft;
• a probe tip coupled with the coupling shaft;
• and
• a capacitor housed within the transducer body, the capacitor includes:
• first and second counter electrodes coupled with the transducer body, and
• a center electrode assembly interposed between the first and second counter electrodes, the center electrode assembly is movable with the coupling shaft relative to the transducer body, and the center electrode assembly includes:
• a center plate coupled with the coupling shaft,
• one or more springs coupled between the transducer body and the center plate, the one or more springs extending from the center plate,
• an upper plate covering the center plate and the one or more springs, the upper plate is engaged with a center plate first face, and
• a lower plate covering the center plate and the one or more springs, the lower plate is engaged with a center plate second face, and the center plate and the one or more springs suspend the upper and lower plates.

A method for using a testing instrument configured for movement or measurement at one or more of a nano or micron scale comprising:

• engaging a probe tip of a coupling shaft with a subject, the coupling shaft is coupled with a capacitor assembly, wherein the capacitor assembly includes:
• a center electrode assembly movable with the coupling shaft, the center electrode assembly includes upper and lower plates engaged to a center plate, the upper and lower plates cover the center plate and one or more springs extending between a transducer body and the center plate, and the center plate and the one or more springs suspend the upper and lower plates, and
• first and second counter electrodes facing the upper and lower plates;
• transmitting at least one excitation signal to the first and second counter electrodes;
• and
• measuring one or more of displacement of the probe tip and force incident on the probe tip according to measurable electrical characteristics in an output signal received from the center electrode assembly based on the at least one excitation signal.