Property measuring device for object to be measured and property measuring method for object to be measured
AssigneeTokyo University of Agriculture and Technology
InventorKenji Ikushima
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo University of Agriculture and Technology
InventorKenji Ikushima
Estimating the term…
[Problem to be Solved] To provide a property measuring device for measuring a measurement object, which can highly reliably extract an electric signal serving as the measurement object from an electromagnetic field noise or the like generated by an acoustic wave generating source even if the acoustic wave is a continuous wave, while a high spatial resolution is maintained, by using an acoustic wave as a properly measuring means for measuring an object and method thereof. [Means for Solving the Problem] A property measuring device 100 for measuring a measurement object of the present invention includes: an acoustic wave emitting portion 40 arranged away from a measurement object 90 and emitting an amplitude-modulated acoustic wave; a receiver 50 for receiving an electromagnetic field generated when the acoustic wave is emitted to the measurement object 90; and a measuring portion 60 for extracting at least one type of properties selected from a group consisting of an electric property, a magnetic property, an electromechanical property, and a magnetomechanical property of the measurement object 90, based on at least one measurement selected from a group consisting of measurements of a strength, a phase, and a frequency of the electromagnetic field.
A property measuring device for measuring a measurement object, the device comprising:
A property measuring method for measuring a measurement object, the method comprising the steps of:
Dependencies are inferred from the claim text.