Time-Correlation of Data
AssigneeTektronix, Inc.
InventorsBradley R. QUINTON, Andrew M. HUGHES, Steven J.E. WILTON
Life of this patent
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AssigneeTektronix, Inc.
InventorsBradley R. QUINTON, Andrew M. HUGHES, Steven J.E. WILTON
Estimating the term…
Test and measurement instrumentation collects time information independently in each clock domain using a device that monotonically changes state with the passage of time according to a local clock domain. The device under test therefore has a unique state for each synchronous time period. The instrumentation periodically samples the devices under test, collects the state of each device, and records the state of the devices in conjunction with any data collected in clock domains that are synchronous with the devices. The periodic samples are transformed into numeric values using an isomorphic or linear model. These values are then fitted to an assumed frequency model that relates the state of devices in otherwise unrelated clock domains.
A method for time-correlating data, the method comprising:
A system for time-correlating data, the system comprising:
A system for time-correlating data, the system comprising:
Dependencies are inferred from the claim text.