Exposure time selection using stacked-chip image sensors

A method for operating a stacked-chip image sensor, wherein the stacked-chip image sensor comprises a planar array of image sensor pixels, an array of vertical conductive vias, and processing circuitry coupled to the planar array of image sensor pixels through the array of vertical conductive vias, the method comprising:

• with the image sensor pixels, capturing a first set of image data;
• providing the captured first set of image data to the processing circuitry using the array of vertical conductive vias;
• with the processing circuitry, storing the first set of image data;
• with the image sensor pixels, capturing a second set of image data;
• with the processing circuitry, determining a motion score for the second set of image data by comparing the second set of image data to the stored first set of image data;
• and
• with the processing circuitry, generating an output image having multiple effective integration times using the determined motion score.

A system, comprising:

• a central processing unit;
• memory;
• input-output circuitry;
• and
• an imaging device, wherein the imaging device comprises:
• a stacked-chip image sensor having a pixel array and storage and processing circuitry that is vertically displaced from the pixel array;
• image processing circuitry coupled to the stacked-chip image sensor through an array of conductive vias;
• and
• a lens that focuses an image onto the pixel array, wherein a portion of the image sensor pixels is configured to capture a first set of image data, wherein the processing circuitry is configured to determine an integration time for the portion of the image sensor pixels based on the first set of image data, and wherein the processing circuitry is configured to read out a second set of image data from the portion of the image sensor pixels through the array of vertical conductive vias after the determined integration time.