Methods and apparatus for x-ray diffraction
OwnerGraeme Mark Hansfordinventor
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Abstract
Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. Modifications of the technique are described to suppress fluorescence signals that would otherwise obscure the diffraction signals.
Claims15
A method of inspecting a material sample by X-ray diffraction wherein the sample is irradiated with a beam of X-ray radiation from a source with a range of photon energies, and wherein at least one energy-resolved spectrum is obtained from radiation diffracted substantially back toward the source.
An apparatus for use in performing back-reflection energy-dispersive X-ray diffraction to determine characteristics of a material sample, the apparatus comprising:
- a source arrangement for irradiating said sample with a beam of radiation at X-ray wavelengths;
- a detector for detecting diffracted radiation returning from a sample in a direction substantially back towards said source;
- and
- a processor for resolving the detected radiation into a spectrum of wavelengths.
A method of X-ray diffraction analysis by detecting spectral characteristics of radiation diffracted by a range of angles close to 180°.
Dependencies are inferred from the claim text.