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AssigneeElectronics and Telecommunications Research Institute
InventorsHyunseok KIM, Su Na Choi, Heyung Sub Lee, Cheol Sig Pyo
Estimating the term…
In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; generating a frequency calibration value by comparing the operation frequency with a calibration target frequency; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.
A method of auto-calibrating integrated circuit chips at a wafer level by calibrating an operation frequency of the integrated circuit chips, the method comprising:
A semiconductor wafer for auto-calibrating an operation frequency of integrated circuit chips, the semiconductor wafer comprising:
A calibration controller for auto-calibrating an operation frequency of integrated circuit chips,
Dependencies are inferred from the claim text.