Minimum-spacing circuit design and layout for pica
AssigneeInternational Business Machines Corporation
InventorsHERSCHEL A. AINSPAN, SEONGWON KIM, FRANCO STELLARI, ALAN J. WEGER
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsHERSCHEL A. AINSPAN, SEONGWON KIM, FRANCO STELLARI, ALAN J. WEGER
Estimating the term…
PICA test circuits are shown that include a first transistor and a second transistor laid out drain-to-drain, such that a gap between respective drain regions of the first and second transistors has a minimum size allowed by a given fabrication technology; a first NOR gate having an output connected to the drain region of the first transistor and accepting a first select signal and an input signal; and a second NOR gate having an output connected to the drain region of the second transistor and accepting a second select signal and the input signal. One of said NOR gates biases the connected transistor's drain region, according to the select signal of said NOR gate, to inhibit an optical emission when said connected transistor is triggered.
A circuit, comprising:
A circuit, comprising:
A test circuit, comprising:
Dependencies are inferred from the claim text.