Semiconductor device including body connected fets

A method of testing a field-effect transistor (FET), the method comprising:

• providing a first field-effect transistor (FET) and a second FET, wherein the first FET and the second FET include similar polarities, and wherein a body of the first FET is electrically coupled to a body of the second FET, and a source of the first FET is electrically coupled to the source of the second FET, such that a body voltage of the second FET controls a body voltage of the first FET;
• measuring a first drain current in a drain of the first FET;
• measuring a second drain current in the drain of the first FET;
• determining an effective current for the first FET based on an average of the first drain current and the second drain current.