Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells
AssigneeArizona Board of Regents, a Body Corporate of the State of Arizona Acting for and on
InventorsYong-Hang Zhang, Jing-Jing Li, Swee Hoe Lim
Life of this patent
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Abstract
A pulsed voltage bias method and/or pulsed light bias method may be used to reduce, minimize, and/or eliminate external quantum efficiency measurement artifacts of multi-junction solar cells, for example artifacts caused by the shunt effect. In this manner, multi-junction solar cells may be designed and constructed with improved performance, efficiency, and the like.
Claims20
A method for eliminating external quantum efficiency measurement artifacts in a multi junction solar cell (MJSC), the method comprising:
- applying a DC light bias to a first subcell in the MJSC, wherein the first subcell is not under test;
- applying a DC voltage bias to the MJSC;
- applying a pulsed voltage bias to the first subcell;
- and
- measuring an external quantum efficiency of a second subcell in the MJSC while the pulsed voltage bias is being applied.
A method for reducing external quantum efficiency measurement artifacts in a multi junction solar cell (MJSC) comprising a top subcell, a middle subcell, and a bottom subcell, the method comprising:
- applying a DC light bias to the top subcell and the middle subcell, wherein the top subcell and the bottom subcell are not under test;
- applying a DC voltage bias to the MJSC;
- applying a pulsed bias to the middle subcell, wherein the pulsed bias comprises at least one of a pulsed light bias and a pulsed voltage bias;
- and
- measuring an external quantum efficiency of the bottom subcell while the pulsed bias is being applied.
A system for reducing external quantum efficiency measurement artifacts in a multi junction solar cell (MJSC), the system comprising:
- an MJSC comprising a top subcell, a middle subcell, and a bottom subcell;
- a DC light bias generator configured to apply a DC light bias to at least one of the top subcell and the middle subcell;
- a DC voltage bias generator configured to apply a DC voltage bias to the MJSC;
- a pulsed bias generator configured to apply a pulsed bias to the middle subcell;
- a chopped monochromatic light generator configured to cause the bottom subcell to create an output current;
- and
- an ammeter configured to measure an external quantum efficiency of the bottom subcell while the pulsed bias generator applies the pulsed bias to the middle subcell.
Dependencies are inferred from the claim text.