Micrometer
AssigneeMitutoyo Corporation
InventorShozaburo TSUJI
Life of this patent
Estimating the term…
Abstract
A micrometer includes: a frame; an anvil; a spindle; an encoder; a display; a strain gauge that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage.
Claims6
A micrometer comprising:
- a U-shaped frame;
- an anvil fixed to one end of the frame;
- a spindle that is screwed to the other end of the frame and is advanced and retracted relative to the anvil;
- an encoder that detects a displacement of the spindle;
- a display that displays a measurement value obtained by processing a detection value detected by the encoder;
- a deformation detecting section that detects a deformation of the frame;
- a storage that stores as a compensation factor a change amount of the detection value per a unit deformation detected by the deformation detecting section;
- and
- a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the deformation detecting section when a command for zeroset is given and a measurement-time deformation that is detected by the deformation detecting section in measurement, and based on the compensation factor stored in the storage.
Dependencies are inferred from the claim text.