Ion sources, systems and methods

A method, comprising:

• providing an ion source comprising a tip;
• providing an ion column;
• passing ions generated by the ion source through the ion column;
• emitting light from the tip of the ion source;
• detecting at least a portion of the light with a detector;
• obtaining an image of the tip of the ion source based on detected light;
• and
• using the detected light to determine one or more parameters for preparing the tip of the ion source.

A method, comprising:

• providing an ion source comprising a tip;
• providing an ion column;
• passing ions generated by the ion source through the ion column;
• emitting light from the tip of the ion source;
• detecting at least a portion of the light with a detector;
• obtaining an image of the tip of the ion source based on detected light;
• and
• using the detected light to determine a temperature of the tip based on the detected light.

A method, comprising:

• passing ions generated by an ion source through an ion column;
• detecting at least a portion of light emitted from a tip of the ion source;
• and
• determining one or more parameters for preparing the tip of the ion source based on at least some of the detected light, and/or determining a temperature of the tip based on at least some of the detected light.