Detection of environmental conditions in a semiconductor chip
AssigneeIntel Mobile Communications GmbH
InventorsHans-Joachim Barth, Horst Baumeister, Peter Baumgartner, Philipp Riess, Jesenka Veledar Krueger
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AssigneeIntel Mobile Communications GmbH
InventorsHans-Joachim Barth, Horst Baumeister, Peter Baumgartner, Philipp Riess, Jesenka Veledar Krueger
Estimating the term…
A capacitive sensor and measurement circuitry is described that may be able to reproducibly measure miniscule capacitances and variations thereof. The capacitance may vary depending upon local environmental conditions such as mechanical stress (e.g., warpage or shear stress), mechanical pressure, temperature, and/or humidity. It may be desirable to provide a capacitor integrated into a semiconductor chip that is sufficiently small and sensitive to accurately measure conditions expected to be experienced by a semiconductor chip.
A circuit, comprising:
A method, comprising:
A semiconductor chip comprising:
A semiconductor chip comprising:
A semiconductor chip comprising:
Dependencies are inferred from the claim text.