High-scan rate positioner for scanned probe microscopy
AssigneeMassachusetts Institute of Technology
InventorsDavid L. Trumper, Ian MacKenzie
Life of this patent
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AssigneeMassachusetts Institute of Technology
InventorsDavid L. Trumper, Ian MacKenzie
Estimating the term…
A system contains a first actuator half containing a first pair of actuator coils and a second pair of actuator coils located above the first pair of actuator coils, wherein the first pair of actuator coils is connected to a first metallic backing. A second actuator half is also providing within the system, which contains a first pair of actuator coils and a second pair of actuator coils located above the first pair of actuator coils, wherein the first pair of actuator coils is connected to a second metallic backing. The system also contains a mechanical flexure suspension having at least one flexure supporting a permanent magnet that is capable of moving, wherein the mechanical flexure suspension is located between the first actuator half and the second actuator half.
A system for scanning at a high scan rate, comprising:
Dependencies are inferred from the claim text.