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AssigneeFujitsu Limited
InventorsSeiji SATTA, Akira Okamoto, Hideyuki Sakamaki, Yoshikazu Iwami, Takumi Nonaka, Hidekazu Osano
Estimating the term…
An integrated circuit includes a fault collection section, and a plurality of modules. Each of the modules includes a fault detection section that detects a fault in the modules, a fault information generation section that generates fault information about the detected fault, a notification section that issues a fault detection notification indicating that a fault is detected to the fault collection section, and a first transmission section that transmits the fault information to the fault collection section. The fault collection section includes a specification section that specifies, based on the fault detection notification, the module from which the fault detection notification has been received first from among the modules, and an acquisition section that acquires the fault information from the module specified by the specification section.
An integrated circuit, comprising:
A fault information processing method for an integrated circuit that includes a fault collection section and a plurality of modules, wherein each of the modules executes:
A fault information collection apparatus that collects a fault from a plurality of modules each including a fault detection section that detects a fault, a fault information generation section that generates, when a fault is detected by the fault detection section, fault information about the detected fault, and a notification section that issues, when a fault is detected by the fault detection section, a fault detection notification indicating that a fault is detected to a fault collection section, the fault information collection apparatus comprising:
Dependencies are inferred from the claim text.