Testing system and method for testing electronic device
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorKANG-BIN WANG
Life of this patent
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Abstract
A testing system for testing an under test electronic device, includes an error capturing and latching unit, a storage unit, and a control terminal. The error capturing and latching unit detects and captures running error signals of the under test electronic device. The storage unit stores the running error signals. The control terminal is connected to the storage unit. The control terminal picks out the running error signals from the storage unit and analyzes these signals.
Claims10
A testing system for testing an under test electronic device, comprising:
- an error capturing and latching unit connected to the under test electronic device, the error capturing and latching unit configured to detect and capture running error signals of the under test electronic device;
- a storage unit connected to the error capturing and latching unit, the storage unit configured to store the running error signals;
- and
- a control terminal connected to the storage unit, the control terminal configured to pick out the running error signals from the storage unit and analyze these signals.
A testing method for testing an under test electronic device, comprising:
- detecting and capturing running error signals of the under test electronic device by an error capturing and latching unit;
- storing the running error signals in a storage unit;
- and
- picking out the running error signals from the storage unit and analyzing these signals by a control terminal
Dependencies are inferred from the claim text.