Pattern recognition of a distribution function
AssigneeSap SE
InventorsSylvia Scheu, Matthias Buehl, Boris Oliver Kneisel
Life of this patent
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AssigneeSap SE
InventorsSylvia Scheu, Matthias Buehl, Boris Oliver Kneisel
Estimating the term…
Various embodiments of systems and methods for pattern recognition of a distribution function are described herein. An influenced distribution function corresponding to an influenced attribute is compared with other distribution functions corresponding to other attributes. Based on the comparison, a correlation is determined between the influenced distribution function and an influencing distribution function from the other distribution functions. Based on the determination, a raw distribution function corresponding to an influenced attribute is extracted using the influenced distribution function and the influencing distribution function. The extracted raw distribution function and the influencing distribution function may be classified.
A computer implemented method for determining a raw distribution function corresponding to an influenced attribute of a plurality of attributes, the method comprising:
An article of manufacture including a computer readable storage medium to tangibly store instructions, which when executed by a computer, cause the computer to:
A computer system for determining a raw distribution function corresponding to an influenced attribute of a plurality of attributes, the computer system comprising:
Dependencies are inferred from the claim text.