Methods of forming a semiconductor device
AssigneeIntersil Americas Inc.
InventorsRick Carlton Jerome, Francois Hebert, Craig McLachlan, Kevin Hoopingarner
Life of this patent
Estimating the term…
Loading patent…
AssigneeIntersil Americas Inc.
InventorsRick Carlton Jerome, Francois Hebert, Craig McLachlan, Kevin Hoopingarner
Estimating the term…
A method and structure for a semiconductor device, the device including a handle wafer, a diamond layer formed directly on a front side of the handle wafer, and a thick oxide layer formed directly on a back side of the handle wafer, the oxide of a thickness to counteract tensile stresses of the diamond layer. Nitride layers are formed on the outer surfaces of the diamond layer and thick oxide layer and a polysilicon is formed on outer surfaces of the nitride layers. A device wafer is bonded to the handle wafer to form the semiconductor device.
A method of forming a semiconductor device, comprising:
A method of forming a semiconductor device, comprising:
Dependencies are inferred from the claim text.