Resist composition, method of forming resist pattern, and polymeric compound
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsDaichi Takaki, Daiju Shiono, Yoshiyuki Utsumi, Jun Iwashita
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsDaichi Takaki, Daiju Shiono, Yoshiyuki Utsumi, Jun Iwashita
Estimating the term…
A resist composition containing a base component (A) which generates acid upon exposure, and exhibits changed solubility in a developing solution under the action of acid, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-0) shown below and a structural unit (a6) that generates acid upon exposure. In the formula, R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R1 represents a sulfur atom or an oxygen atom, R2 represents a single bond or a divalent linking group, and Y represents a hydrocarbon group in which a carbon atom or a hydrogen atom may be substituted with a substituent.
A resist composition, comprising a base component (A) which generates acid upon exposure, and exhibits changed solubility in a developing solution under action of acid, wherein
A polymeric compound having a structural unit (a5) represented by general formula (a5-0) shown below and a structural unit (a6) that generates acid upon exposure:
Dependencies are inferred from the claim text.