Systems and methods for efficient feature extraction accuracy using imperfect extractors

A method for efficient feature data analysis, comprising:

• determining, by at least one electronic circuit, a first number of screen pages needed to verify that each of a plurality of clusters of detected features comprises only detected features which were correctly identified during feature extraction/detection operations as being of the same feature class as a selected feature of an image;
• determining, by the electronic circuit, a second number of screen pages needed to verify that each of a plurality of singular detected features was correctly identified during feature extraction/detection operations as being of the same feature class as the selected feature of the image;
• selecting, by the electronic circuit, one of a plurality of different validation processes based on values of the first number of screen pages and the second number of screen pages;
• and
• performing the selected one of the plurality of validation processes to verify that each of the detected features was correctly identified during the feature extraction/detection operations as being of the same feature class as the selected feature of the image.