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US 2013/0156072 A1Published application
Electrical storage device temperature measuring method
AssigneeAlps Green Devices Co., Ltd.
InventorHiroyuki HEBIGUCHI
Life of this patent
Estimating the term…
Abstract
An internal impedance of an electrical storage device is measured by using a signal of a frequency which ions in the electrical storage device are difficult to follow (e.g., a frequency equal to or higher than 10 kHz), and an internal temperature of the electrical storage device is calculated from a measured value of the internal impedance.
Claims15
An electrical storage device temperature measuring method comprising:
- measuring an internal impedance of an electrical storage device by using a signal of a frequency which ions in the electrical storage device are difficult to follow;
- and
- calculating an internal temperature of the electrical storage device from a measured value of the internal impedance.
An electrical storage device temperature measuring method comprising:
- measuring an internal impedance of an electrical storage device by using a signal of a frequency equal to or higher than 10 kHz;
- and
- calculating an internal temperature of the electrical storage device from a measured value of the internal impedance.
An electrical storage device temperature measuring method comprising:
- measuring an internal impedance of an electrical storage device by using a signal of a frequency in which an inductance component of the internal impedance of the electrical storage device is more dominant than a capacitance component thereof;
- and
- calculating an internal temperature of the electrical storage device from a measured value of the internal impedance.
An electrical storage device temperature measuring method comprising:
- measuring an internal impedance of an electrical storage device by using a signal of a frequency in which a resistance component of the internal impedance of the electrical storage device is increased with increase in a temperature;
- and
- calculating an internal temperature of the electrical storage device from a measured value of the internal impedance.
Dependencies are inferred from the claim text.