US 2013/0155827 A1 · METHOD AND SYSTEM FOR DETERMINING THE QUALITY OF A STORAGE SYSTEM

Abstract

In accordance with an exemplary embodiment of the present invention, a method for measuring a quality parameter of an optical storage system comprising a non-diffraction-limited optical storage medium and a readout device, the method comprising the process of deriving an impulse response of the optical storage system, and the process of analyzing the impulse response to determine at least one of a width of the impulse response and a skewness of the impulse response as the quality parameter.

Claims7

Dependent claims

A method for measuring a quality parameter of an optical storage system, the storage system comprising a readout device and a non-diffraction-limited optical storage medium carrying predefined data, the method comprising:

deriving, based on a readout of the predefined data, an impulse response of the optical storage system, as a sequence of impulse response samples;
and
analyzing the impulse response to determine as the quality parameter at least one of a width of the impulse response and a skewness of the impulse response.

Dependencies are inferred from the claim text.

Facts

Application

13/820,543Filed 6 Sep 2011

Priority

EP 10305963.08 Sep 2010

Published

20 Jun 2013

Term ends

Not estimatedThe source records don’t support an estimate.

Classification8 codes

G11B 20/1816
Error detection or correction; Testing , e.g. of drop-outs: testing
G11B 7/1267
Circuits, methods or arrangements for laser control or stabilisation: power calibration
G11B 7/24
Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the…:…
G11B 20/182
Testing: using test patterns

Method and system for determining the quality of a storage system

Life of this patent

Method and system for determining the quality of a storage system

Life of this patent

Abstract

Claims7