Refractive index measurment apparatus and refractive index measurment method
AssigneeCitizen Holdings Co., Ltd.
InventorsYuka Saito, Nobuyuki Hashimoto
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AssigneeCitizen Holdings Co., Ltd.
InventorsYuka Saito, Nobuyuki Hashimoto
Estimating the term…
A refractive index measurement apparatus 1 includes a light source 10, a measurement cell (12, 22) including a sample (125, 226) as an object of refractive index measurement and diffracting light incident from the light source, a detector 13 that detects the amount of diffracted light in at least one diffraction order other than zero order of diffracted light exiting from the measurement cell, and a control unit 15 that determines refractive index of the sample corresponding to measured value of the amount of diffracted light detected in at least one diffraction order by the detector. The measurement cell includes a first substrate (121, 221) and a second substrate (121, 221) disposed so as to be opposed to each other and a diffraction grating (123, 225) disposed between the first substrate and the second substrate, and the diffraction grating has a plurality of members whose width in the direction parallel to a surface of the first substrate decreases stepwise as approaching from the first substrate to the second substrate, the sample (125, 226) as the object of refractive index measurement being filled in the space between the first substrate and the second substrate not occupied by the diffraction grating.
A refractive index measurement apparatus comprising:
A refractive index measurement method comprising the steps of:
Dependencies are inferred from the claim text.