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AssigneeCarl Zeiss Microscopy GmbH
InventorsDr. Thomas Kalkbrenner, Michael Goelles
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The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver. At least the second part of the detection light runs in an optical element having an optical density that is increased as compared with the first detection beam path, in order to lengthen the optical path length, and the optical element is designed to be displaceable at an angle, preferably perpendicular, to the optical axis of the first detection beam path in order to adjust the optical path length, and has flat surfaces, at least on the light entry and light exit side thereof; a prism is provided, preferably a glass prism, preferably at least in the second detection beam path after a first beam deflection, for deflection in a direction parallel to the first detection beam path, in order to increase the path length and for reverse deflection.
A microscope having an illumination beam path with wide-field illumination of a sample and a first detection-beam path that includes a spatially resolved surface receiver, that is reached by a first part of the detection light coming from the sample via the first detection-beam path or an image splitter arrangement for a microscope, and at least a second part of the detection light coming from the sample is masked out of the detection-beam path in order to lengthen the optical path length, and, via deflection means associated with the detection-beam path, it is guided in at least a second detection-beam path and, via further deflection means, is deflected back in the direction of the detection in such a way that detection light is caused to be incident on at least two adjoining partial areas on the surface receiver, wherein at least the second part of the detection light runs at least in part to an optical element having a refractive index that is increased in comparison to the first detection-beam path, in order to lengthen the optical path length, and in that the optical element is designed to be movable at an angle, perpendicular to the optical axis of the first detection beam path, in order to adjust the length of the optical path, and in that it includes flat surfaces at least on its light-entry and light-exit sides.
A microscope having an illumination beam path with wide-field illumination of a sample and a first detection beam path that includes a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image splitter arrangement for a microscope, wherein at least a second part of the detection light coming from the sample is diverted out of the detection beam path in order to lengthen the optical path length and, via deflection means associated with the detection-beam path, is guided in at least a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is caused to be incident on at least two adjoining partial areas on the surface receiver, and wherein at least one part of the deflection means is designed for being movable at an angle, to the optical axis of the first detection beam path for adjustment of the optical path length.
A microscope having an illumination beam path with wide-field illumination of a sample and a first detection beam path that includes a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image splitter arrangement for a microscope, wherein at least a second part of the detection light coming from the sample is diverted out of the detection beam path in order to lengthen the optical path length and, via deflection means associated with the detection-beam path, it is guided in at least a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is caused to be incident on at least two adjoining partial areas on the surface receiver, wherein a splitting takes place into four detection beam paths that impinge upon one or more detectors at an offset to one another via partially transparent mirrors and deflection elements.
Dependencies are inferred from the claim text.