System for automatic structure footprint detection from oblique imagery
AssigneePictometry International Corp.
InventorsStephen L. Schultz, Yandong Wang
Life of this patent
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AssigneePictometry International Corp.
InventorsStephen L. Schultz, Yandong Wang
Estimating the term…
A set of instructions stored on at least one computer readable medium for running on a computer system. The set of instructions includes instructions for identifying edges of a structure displayed in multiple oblique images, instructions for determining three-dimensional information of the edges including position, orientation and length of the edges utilizing multiple oblique images from multiple cardinal directions, and instructions for determining, automatically, at least one line segment of a portion of a footprint of the structure utilizing at least one of the relative position and orientation of the edges.
A set of instructions stored on at least one non-transitory computer readable medium for running on a computer system, comprising:
A method, comprising the step of:
A method, comprising the step of:
A method comprising the step of:
A computer system, comprising:
Dependencies are inferred from the claim text.