Testing apparatus and method for testing analog-to-digital converter
AssigneeSilicon Motion, Inc.
InventorHung-Sheng CHANG
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AssigneeSilicon Motion, Inc.
InventorHung-Sheng CHANG
Estimating the term…
The invention provides a testing apparatus. In one embodiment, the testing apparatus receives a plurality of bit signals output by an analog-to-digital converter, and comprises a plurality of frequency counters and a comparison module. The frequency counters respectively calculate a plurality of transition frequencies of the values of the bit signals. The comparison module respectively compares the transition frequencies with a plurality of ideal transition frequencies to obtain a plurality of error frequencies. The performance analysis module estimates a performance value of the analog-to-digital converter according to the error frequencies.
A testing apparatus, receiving a plurality of bit signals output by an analog-to-digital converter, comprising:
A method for testing an analog-to-digital converter, comprising:
Dependencies are inferred from the claim text.