US 2013/0154723 A1 · PERFORMANCE, THERMAL AND POWER MANAGEMENT SYSTEM ASSOCIATED WITH AN INTEGRATED CIRCUIT AND RELATED METHOD

Abstract

The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Claims26

Dependent claims

A performance, thermal and power (PTP) management system associated with an integrated circuit (IC), comprising:

a performance circuit with adjustable configurations for simulating operations of the IC when receiving a supply voltage;
a sensing module configured to measure a characteristic of the performance circuit;
a memory for storing characterization data associated with the IC;
and
a PTP controller configured to:
set the performance circuit in a specific configuration according to the characterization data;
and
adjust a level of the supply voltage according to the characteristic of the performance circuit.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application

13/719,193Filed 18 Dec 2012

Priority

19 Dec 2011

Published

20 Jun 2013

Term ends

Not estimatedThe source records don’t support an estimate.

Classification12 codes

G05F 1/462
Wherein the variable actually regulated by the final control device is DC: as a function of the requirements of the load, e.g. delay, temperature,…
G01R 31/2834
Specific tests of electronic circuits not provided for elsewhere: automated test systems [ATE]; using microprocessors or computers
G01R 31/31721
Testing of digital circuits: power aspects, e.g. power supplies for test circuits, power saving during test
G01R 31/31724
Testing of digital circuits: test controller, e.g. BIST state machine

Performance, thermal and power management system associated with an integrated circuit and related method

Life of this patent

Performance, thermal and power management system associated with an integrated circuit and related method

Life of this patent

Abstract

Claims26