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US 2013/0154679 A1Published application
Testing system
AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorCheng-hung Chen
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AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorCheng-hung Chen
Estimating the term…
Disclosed is a testing system, which includes a thin film transistor substrate. The thin film transistor substrate includes a plurality of thin film transistors and a plurality of connecting pads. Each of the thin film transistors includes a first electrode, a second electrode, and a third electrode. The thin film transistor substrate further includes a testing pad. One of the first electrode and the second electrode of each of the thin film transistors is electrically connected with one of the connecting pads. The third electrode and the other one of the first electrode and the second electrode of each of the thin film transistors are electrically connected with the testing pad. The testing system of the present invention is capable of decreasing the cost of the testing system and the complexity of disposed circuits.
A testing system, comprising a thin film transistor substrate and a plurality of probes, the thin film transistor substrate comprising a plurality of thin film transistors and a plurality of connecting pads, each of the thin film transistors comprising a first electrode, a second electrode, and a third electrode, wherein the thin film transistor substrate further comprises a testing pad, one of the first electrode and the second electrode of each of the thin film transistors is electrically connected with one of the connecting pads, the third electrode and the other one of the first electrode and the second electrode of each of the thin film transistors are electrically connected with the testing pad,
A testing system, comprising a thin film transistor substrate, the thin film transistor substrate comprising a plurality of thin film transistors and a plurality of connecting pads, each of the thin film transistors comprising a first electrode, a second electrode, and a third electrode, wherein the thin film transistor substrate further comprises a testing pad, one of the first electrode and the second electrode of each of the thin film transistors is electrically connected with one of the connecting pads, the third electrode and the other one of the first electrode and the second electrode of each of the thin film transistors are electrically connected with the testing pad.
A testing system, comprising a thin film transistor substrate, the thin film transistor substrate comprising a plurality of thin film transistors and a plurality of connecting pads, each of the thin film transistors comprising a first electrode, a second electrode, and a third electrode, wherein the thin film transistor substrate further comprises a first testing pad and a second testing pad, one of the first electrode and the second electrode of each of the thin film transistors is electrically connected with the first testing pad, the other one of the first electrode and the second electrode of each of the thin film transistors is electrically connected with one of the connecting pads, and the third electrode of each of the thin film transistors is electrically connected with the second testing pad.
Dependencies are inferred from the claim text.