Apparatus and method for testing pad capacitance

A testing method, comprising:

• resetting a voltage level at a pad, by a test circuit disposed on a die that includes the pad;
• coupling the pad to a supply voltage for a time period;
• and
• determining a first voltage of the pad at a first time point at or near the end of the time period.

A computing apparatus, comprising:

• a processor disposed on a die and having one or more pads;
• and
• a test circuit disposed on the die, the test circuit including:
• a pulldown device coupled to a first pad of the one or more pads, the pulldown device being configured to receive a reset signal and to turn on a conductive path between the first pad and a ground terminal in response to the reset signal;
• a pullup resistor having a first terminal and a second terminal, the first terminal being coupled to the first pad and the second terminal being coupled to a pullup node;
• and
• a pullup device coupled between the pullup node and a supply node, the supply node being configured to receive a supply voltage, and the pullup device being configured to receive a pullup signal and to turn on a conductive path between the supply node and the pullup node for a time period in response to the pullup signal.