Testing system and method for electronic device

Abstract

A testing system for testing an under test electronic device, includes a power supply status detection module, a temperature detection module, an error detection module, a storage unit, and a control terminal. The power supply status detection module detect power supply status of the under test electronic device and generates corresponding power signal. The temperature detection module detects temperature in the under test electronic device and generates corresponding temperature signal. The error detection module detects running error of the under test electronic device and generates corresponding error occurring signal. The storage unit stores the power signal, the temperature signal, and the error occurring signal. The control terminal picks out the power signal, the temperature signal, and the error occurring signal from the storage unit and analyzes these signals.

Dependencies are inferred from the claim text.