Semiconductor structure and manufacturing method of the same
AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsHuilong Zhu, Haizhou Yin, Zhijiong Luo
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AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsHuilong Zhu, Haizhou Yin, Zhijiong Luo
Estimating the term…
The present invention provides a semiconductor structure and a manufacturing method thereof. The method comprises: providing a semiconductor substrate comprising semiconductor devices; depositing a copper diffusion barrier layer on the semiconductor substrate; forming a copper composite layer on the copper diffusion barrier layer; decomposing the copper composite at corresponding positions, where copper interconnection is to be formed, into copper according to the shape of the copper interconnection; and etching off the undecomposed copper composite and the copper diffusion barrier layer underneath, to interconnect the semiconductor devices. The present invention is adaptive for manufacturing interconnection in integrated circuits.
1-20. (canceled)
A semiconductor structure, comprising:
The semiconductor structure according to claim 1, wherein the spacers are formed of at least one of TaN, TiN, Ta, Ti, TiSiN, TaSiN, TiW, WN, and Ru.
Dependencies are inferred from the claim text.