Glass composition for protecting semiconductor junction, method of manufacturing semiconductor device and semiconductor device
AssigneeShindengen Electric Manufacturing Co., Ltd.
InventorsAtsushi Ogasawara, Kazuhiko Ito, Koji Ito
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Abstract
A glass composition for protecting a semiconductor junction contains at least SiO2, Al2O3, MO, and nickel oxide, and substantially contains none of Pb, P, As, Sb, Li, Na and K (M in MO indicates one of alkali earth metals).
Claims18
A glass composition for protecting a semiconductor junction, wherein the glass composition for protecting a semiconductor junction contains at least SiO2, Al2O3, MO, and “at least one metal oxide selected from a group consisting of nickel oxide, copper oxide and manganese oxide”, and substantially contains none of Pb, P, As, Sb, Li, Na and K. (Here, M in said MO indicates one of alkali earth metals.)
A method of manufacturing a semiconductor device comprising:
- a first step of preparing a semiconductor element having a pn junction exposure portion where a pn junction is exposed;
- and
- a second step of forming a glass layer such that the glass layer covers the pn junction exposure portion in this order, wherein
- in the second step, the glass layer is formed using a glass composition for protecting a semiconductor junction which contains at least SiO2, Al2O3, MO, and “at least one metal oxide selected from a group consisting of nickel oxide, copper oxide and manganese oxide”, and substantially contains none of Pb, P, As, Sb, Li, Na and K.
- (Here, M in said MO indicates one of alkali earth metals.)
A semiconductor device comprising:
- a semiconductor element having a pn junction exposure portion where a pn junction is exposed;
- and
- a glass layer which is formed such that the glass layer covers the pn junction exposure portion, wherein
- the glass layer is formed using a glass composition for protecting a semiconductor junction which contains at least SiO2, Al2O3, MO, and “at least one metal oxide selected from a group consisting of nickel oxide, copper oxide and manganese oxide”, and substantially contains none of Pb, P, As, Sb, Li, Na and K.
- (Here, M in said MO indicates one of alkali earth metals.)
Dependencies are inferred from the claim text.