Semiconductor device and method for manufacturing same
AssigneeSumitomo Electric Industries, Ltd.
InventorsTakeyoshi Masuda, Keiji Wada, Toru Hiyoshi, Shinji Matsukawa
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AssigneeSumitomo Electric Industries, Ltd.
InventorsTakeyoshi Masuda, Keiji Wada, Toru Hiyoshi, Shinji Matsukawa
Estimating the term…
A MOSFET includes: a substrate made of silicon carbide and having a first trench and a second trench formed therein, the first trench having an opening at the main surface side, the second trench having an opening at the main surface side and being shallower than the first trench; a gate insulating film; a gate electrode; and a source electrode disposed on and in contact with a wall surface of the second trench. The substrate includes a source region, a body region, and a drift region. The first trench is formed to extend through the source region and the body region and reach the drift region. The second trench is formed to extend through the source region and reach the body region.
A semiconductor device comprising:
A method for manufacturing a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.