Semiconductor device and method of manufacturing the semiconductor device
AssigneeRenesas Electronics Corporation
InventorsNaoya INOUE, Kishou KANEKO, Yoshihiro HAYASHI
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AssigneeRenesas Electronics Corporation
InventorsNaoya INOUE, Kishou KANEKO, Yoshihiro HAYASHI
Estimating the term…
Disclosed is a semiconductor device provided with an active element in a multilayer interconnect layer and decreased in a chip area. A second interconnect layer is provided over a first interconnect layer. A first interlayer insulating layer is provided in the first interconnect layer. A semiconductor layer is provided in a second interconnect layer and in contact with the first interlayer insulating layer. A gate insulating film is provided over the semiconductor layer. A gate electrode is provided over the gate insulating film. At least two first vias are provided in the first interconnect layer and in contact by way of upper ends thereof with the semiconductor layer.
A semiconductor device comprising:
The semiconductor device according to claim 15, further comprising:
A method of manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.