Systems and methods for defect detection using exoelectrons
AssigneeGeneral Electric Company
InventorsStanton Earl Weaver, Joseph Darryl Michael
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Abstract
An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
Claims20
A defect detection system comprising:
- an exoemission sensor comprising a conductive layer and an insulating layer, the exoemission sensor mountable to a material of interest and configured to directly receive exoemissions from the material of interest, while in an atmosphere and electrically biased to the material of interest, and to output a signal based upon the received emissions;
- and
- an analysis device configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
A method of detecting a defect in a material in an atmosphere, comprising:
- placing an exoemission sensor on the material in a test location;
- electrically biasing the exoemission sensor to the material of interest;
- receiving exoemissions of the material by the sensor, the sensor outputting signals based upon received exoemissions;
- comparing a later received signal to a previously received signal;
- determining whether a defect is present in the material based upon the comparison.
An in-atmosphere defect detection system comprising:
- at least one flexible exoemission sensor mountable to a material of interest and comprising a conductive layer and a patterned insulating layer disposed on a surface of the conductive layer, the exoemission sensor configured to output a signal based upon received exoemissions;
- wherein the patterned layer is configured to maintain an electrical bias between the exoemission sensor and the material of interest;
- and an analysis device in communication with the sensor and configured to determine whether a defect in the material exists based upon the received signals.
Dependencies are inferred from the claim text.