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AssigneeAirsense Analytics GmbH
InventorsWolf Münchmeyer, Bert Ungethüm, Andreas Walte
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The invention relates to a method for ionizing and identifying gases, wherein the gases to be identified are ionized in a reaction chamber and the product ions are measured, wherein the measurement of the product ions takes place via electrical fields acting on the product ions and the detection is performed with a detector for ions. It is provided that ionization takes place via UV radiation, and that simultaneously or sequentially ionization by electrons takes place. The invention further relates to a device for ionizing and identifying gases, which includes an ion source chamber having an ion source and an ion mobility spectrometer. For this purpose, a partition between the ion source chamber and the ion mobility spectrometer has a UV-transparent window and a window permeable for electrons, wherein UV radiation and electron radiation can be generated in the ion source chamber with the ion source.
Method for identifying and ionizing gases, wherein the gases to be identified are ionized in a reaction chamber and the product ions are measured, wherein the measurement of the product ions takes place by exposing the product ions to electric fields and the detection is performed with a detector for ions, wherein the ionization is performed using UV radiation, and that simultaneously or sequentially an ionization with electrons is performed.
Method according to wherein for identifying the substances, the spectra measured by ionization with UV radiation and the spectra measured by ionization with electron bombardment are considered in combination and the substances are identified using methods using database comparison.
Device for ionizing and identifying gases, comprising an ion source chamber having an ion source and an ion mobility spectrometer, wherein a partition between the ion source chamber and the ion mobility spectrometer has a window transparent to UV radiation and a window permeable for electrons, wherein UV radiation and electron radiation can be generated by the ion source in the ion source chamber.
Dependencies are inferred from the claim text.